Field-emission microscopy

Field-emission microscopy (FEM) is an analytical technique that is used in materials science to study the surfaces of needle apexes. The FEM was invented by Erwin Wilhelm Müller in 1936, and it was one of the first surface-analysis instruments that could approach near-atomic resolution.

This article is issued from Wikipedia. The text is licensed under Creative Commons - Attribution - Sharealike. Additional terms may apply for the media files.