Wavelength-dispersive X-ray spectroscopy
| Acronym | WDXS WDS | 
|---|---|
| Classification | Spectroscopy | 
| Analytes | Elements in solids, liquids, powders and thin films | 
| Manufacturers | Anton Paar, Bruker AXS, Hecus, Malvern Panalytical, Rigaku Corporation, Xenocs, CAMECA, JEOL, Oxford Instruments | 
| Other techniques | |
| Related | Energy-dispersive X-ray spectroscopy | 
Wavelength-dispersive X-ray spectroscopy (WDXS or WDS) is a non-destructive analysis technique used to obtain elemental information about a range of materials by measuring characteristic x-rays within a small wavelength range. The technique generates a spectrum in which the peaks correspond to specific x-ray lines, and elements can be easily identified. WDS is primarily used in chemical analysis, wavelength dispersive X-ray fluorescence (WDXRF) spectrometry, electron microprobes, scanning electron microscopes, and high-precision experiments for testing atomic and plasma physics.